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Publications of SPCL

M. Besta, P. Iff, M. Schneider, N. Blach, A. Maissen, S. Di Girolamo, J. Domke, J. Krattenmacher, K. Lakhotia, L. Monroe, F. Petrini, R. Gerstenberger, T. Hoefler:

 EvalNet: A Practical Toolchain for Generation and Analysis of Extreme-Scale Interconnects

(In Proceedings of the 40th IEEE Interational Parallel and Distributed Processing Symposium, presented in New Orleans, LA, USA, IEEE Press, May 2026)

Abstract

The diversity of communication paths in a network - especially non-minimal paths - is a key enabler of performance at extreme scales. We present EvalNet, a toolchain for scalable generation and analysis over 25 important network topologies, such as Slim Fly, PolarFly, and Orthogonal Fat Trees, with a strong focus on path diversity metrics. EvalNet provides an extensive and fine-grained analysis of shortest and non-shortest paths, including their multiplicities, lengths, and interference. It supports exact measurement and visualization of bandwidth and throughput between every router pair, enabling unprecedented insight into routing potential. EvalNet also includes detailed models for construction cost and power consumption, and interfaces seamlessly with established simulators, which we tune to support large-scale evaluations on low-cost hardware. Using EvalNet, we deliver the widest and most comprehensive path diversity study to date, demonstrating how path diversity underpins throughput and scalability, and facilitating progress towards new frontiers in extreme-scale network design.

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BibTeX

@inproceedings{besta2026evalnet,
  author={Maciej Besta and Patrick Iff and Marcel Schneider and Nils Blach and Alessandro Maissen and Salvatore Di Girolamo and Jens Domke and Jascha Krattenmacher and Kartik Lakhotia and Laura Monroe and Fabrizio Petrini and Robert Gerstenberger and Torsten Hoefler},
  title={{EvalNet: A Practical Toolchain for Generation and Analysis of Extreme-Scale Interconnects}},
  year={2026},
  month={05},
  booktitle={Proceedings of the 40th IEEE Interational Parallel and Distributed Processing Symposium},
  location={New Orleans, LA, USA},
  publisher={IEEE Press},
  doi={10.48550/arXiv.2105.12663},
}